Refine your search
Collections
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All
Sathish Kumar, A.
- Pseudo-Exhaustive Pattern Generators for BIST
Abstract Views :118 |
PDF Views:3
Authors
Affiliations
1 Department of Electrical and Electronics Engineering, Velalar College of Engineering and Technology, Erode, IN
2 Department of Electrical and Electronics Engineering, Velalar College of Engineering and Technology, Erode, IN
1 Department of Electrical and Electronics Engineering, Velalar College of Engineering and Technology, Erode, IN
2 Department of Electrical and Electronics Engineering, Velalar College of Engineering and Technology, Erode, IN
Source
Software Engineering, Vol 3, No 5 (2011), Pagination: 212-215Abstract
Pseudo-exhaustive pattern generators for built-in self-test (BIST) provide high fault coverage of detectable combinational faults with much fewer test vectors than exhaustive generation. In (n,k)-adjacent bit pseudo-exhaustive test sets, all 2^k binary combinations appear to all adjacent k-bit groups of inputs. With recursive pseudo-exhaustive generation, more than one module can be pseudo-exhaustively tested in parallel. In order to detect sequential (e.g., stuck-open) faults that occur into current CMOS circuits, two-pattern tests are exercised. Also, delay testing, commonly used to assure correct circuit operation at clock speed requires two-pattern tests. In this paper a pseudo-exhaustive two-pattern generator is presented, that recursively generates all two-pattern (n,k)-adjacent bit pseudo-exhaustive tests for all . To the best of our knowledge, this is the first time in the open literature that the subject of recursive pseudo-exhaustive two-pattern testing is being dealt with. A software-based implementation with no hardware overhead is also presented.Keywords
Built-In Self-Test (BIST), Pseudoexchaustive Two pattern Testing, Test Pattern Generation.- Impact of Oxidation Inhibitors on Performance and Emission Characteristics of a Low Heat Rejection Engine
Abstract Views :234 |
PDF Views:107
Authors
Affiliations
1 St. Joseph’s Institute of Tech., Chennai, IN
1 St. Joseph’s Institute of Tech., Chennai, IN